New EU project ’ONEM’ develops a unique hybrid imaging technique

The Low Energy Electron Microscope at Leiden University will form the basis for Optical Near-field Electron Microscopy (ONEM). ONEM is a new technique for nanoscale imaging of interfaces that is being developed by groups at the Univ. of Vienna, at the J. Heyrovský Institute of the Czech Academy of Sciences, and at Leiden University. (©B. van Wayenburg) - The ONEM project will develop a new non-invasive microscopy technique for imaging dynamic processes at interfaces, called Optical Near-field Electron Microscopy. Led by physicist Thomas Juffmann from the University of Vienna, ONEM - which has a budget of 3,7 million Euro - is one of only two proposals that succeeded in the topic "Measuring the Unmeasurable" of the call from the European Innovation Council. It starts in March.